Open time: 8 : 00 AM - 5 : 30 PM (Monday - Saturday)
Open time: 8 : 00 AM - 5 : 30 PM (Monday - Saturday)
Available on backorder
• Best-in-class rotational accuracy in compact type roundness
measuring instruments
• Fine adjustment on both X- and Z-axes
• Multiple analyses through simple operation
• D.A.T. function *except for centering/leveling device: Analog mic-head type
• Scaled Z-axis
• Continuous ID and OD measurement
• High-precision air bearing
• Wide-range detector
• Simple setup and display of results
• Built-in printer
• Supports 16 languages
The large color LCD screen with backlight shows easy-to-understand measurement results and graphs. Forms can be checked and notch processing can be set while observing the displayed graphs.
Unwanted data, such as that produced by notches or scratches, can be excluded from the analysis if desired. Select between [Automatic setting] and [Arbitrary setting].
| Model | RA-120 |
| Turntable | |
| Rotational accuracy: | (0.04+6H/10000)µmH: Probing height (mm) |
| Rotating speed: | 6rpm |
| Table top diameter: | ø 1.96” (150mm) |
| Centering range | :±.12” (3mm) |
| Leveling range: | ±1° |
| Maximum probing diameter: | ø 11” (280mm) |
| Maximum workpiece diameter: | ø 17.3” (440mm) |
| Maximum workpiece weight: | 55 lbs (25kg) |
| Vertical column (Z-axis) | |
| Vertical travel: | 11” (280mm) |
| Feeding: | 1.18” (30mm)/rev. (coarse) 0.039” (1mm)/rev. (fine) |
| Maximum probing height: | 11” (280mm) from the turntable top |
| Maximum probing depth: | 3.94” (100mm) (min. ID: 1.18”(30mm) |
| Horizontal arm (X-axis) | |
| Horizontal travel: | 65” (165mm) (Including a protrusion of 1” (25mm) the turntable rotation center) |
| Probe and stylus | |
| Measuring range: | ±1000μm |
| Measuring force: | 7 to 10mN |
| Standard stylus: | 12AAL021, carbide ball, ø1.6mm |
| Measuring direction: | Two directional |
| Stylus angle adjustment: | ±45° (with graduations) |
| Data analysis unit: | |
| Data sampling points: | 3,600 points/rotation |
| Data analysis items: | Roundness, Coaxiality, Concentricity, Flatness, Circular runout (radial), Circular runout (axial), Squareness (against axis), Squareness (against plane), Thickness deviation, Parallelism |
| Reference circles for roundness evaluation: | LSC, MZC, MIC, MCC Recording device: |
| Recording device: | Built-in thermal line printer |
| Recording magnification: | X5 to X200,000, Auto |
| Roughness component reduction: | Low pass filter, band pass filter |
| Filter type: | 2CR-75%, 2CR-50%, 2CR-75% (phase corrected) 2CR-50% (phase corrected), Gaussian, filter OFF |
| Cutoff value: | 15upr, 50upr, 150upr, 500upr, 15-150upr, 15-500upr |
