Hardness Testing
Machine
HM-210/Type B V/K

Contact
HM-210/Type B V/K
Mitutoyo
Contact

Available on backorder

Catalogue

SPECIFICATIONS

Fixed test force (mN) 98.07, 196.1, 294.2, 490.3, 980.7, 1961, 2942, 4903, 9807 (10gf-1000gf
Arbitrary test force ≤100 gf in 1 gram increments, > 100gf in 10 gram increments
Test force control Force generation by electromagnetic and automatic control (load, dwell, unload)
Control unit None, By PC*
Loading rate 60 µ/ sec
Load dwell time 0-999 sec
Indenter Vickers and Knoop
Objective lenses 10x, 20x, 50x
Objective turret Motor-driven and manual operation
Filar eye piece  None
CCTV camera 3 megapixel, 1/2”
Software AV Pak

System B is equipped with AVPAK-10, a the software package that automatically measures the diagonal length of an indentation and calculates the corresponding hardness value. This means that measurement error caused by variation in operator interpretation is eliminated, thereby reducing costs.

AVPAK software for controlling Systems B

New functions

Pattern creation

This tool supports the creation of test patterns such as straight lines, zigzag lines, and teaching patterns.

Pattern pasting

This tool supports the pasting of created test patterns. It adjusts the origin, direction, etc., to paste a pattern.

Handling of multiple specimens

Multiple specimens can be tested when a part program and Parts Manager are used.

Parts Manager

Executes a common part program for specimens having the same shape.

Reading of indentations

Improvement in image-processing performance has improved the indentation measurement function.

Indentation depth display

Displays the indentation depth of the diamond indenter while the testing force is being applied. (Reference value)

Property panel

Used for setting the test conditions such as the test force and load time, as well as the indentation measurement condition.

Navigation function

When the test position is being moved during multi-point testing, this function guides the travel of the XY fine adjustment manual stage to the next position.