High-accuracy
Probe
SP-80

Contact
SP80
Mitutoyo
Contact

Available on backorder

Catalogue

  • Scanning probes can acquire several hundred surface points each second, enabling measurement of form as well as size and position.
  • Scanning probes can also be used to acquire discrete points in a similar way to touch-trigger probes.
  • A range of solutions is available, suitable for all sizes and configurations of CMM.