Surface Measuring
Surftest
SJ-500

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SJ-500
Mitutoyo
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Available on backorder

Catalogue

Improved operability

7.5 Color TFT LCD
The dedicated data processor has a high-visibility 7.5″ color TFT LCD. Icon display and touch panel operation provide user-friendly display and easy operation.
Positioning by joystick and manual control knobs on the processor
Easy-to-operate joystick. Fine positioning of stylus required for small-hole measurements can be easily performed using the manual fine-adjustment knobs.
Multiple trace function
A machine can be programmed to take up to three traces, one after the other.
Auto leveling table (optional)
Automatically levels the surface to be tested for easy, strain-free setup.

Various types of analysis

Capable of fine-contour analysis
Supports 43 types of analysis parameters, complying with surface roughness standards such as ISO 1997 and JIS 2001. Also capable of various fine-contour analysis.

* Contour analyses: Area, circle, angle, coordinate difference, step, inclination

High-durability

Ceramic guideway
A ceramic guideway, inherently free from wear and deterioration with age, is employed to maintain the traversing straightness of the drive unit (X-axis) indefinitely. Maintenance-free design,  ince anti-corrosion treatment is not required for ceramic.

High-visibility color display panel

A high-visibility 7.5″ color TFT LCD, color icon display and touchoperated panel provide user-friendly, easy operation. Built-in thermal printer. Fine contour analysis provided as standard.

Supports 16 languages
Japanese, English, German, French, Italian, Spanish, Portuguese, Korean, Simplified Chinese, Traditional Chinese, Czech, Polish, Hungarian, Turkish, Swedish, Dutch

Multiple trace programming function

SV-2100S4/H4/W4

X-axis tracing with programmed Z-axis shifts possible

Efficient positioning by joystick and adjustment knobs

Both a fast-traverse joystick (X-axis: .78″/s (20mm/s) for SJ-500, 1.98″/s (40mm/s) for SV-2100, Z2-axis: .78″/s (20mm/s) for SV2100S4/H4/W4) and manual fine-adjustment knobs, essential or positioning in small hole measurement, are standard features.

Positioning in small hole measurement

Positioning in Y/Z-directions with  column fine-adjustment knob (or detector elevation knob) and optional cross-travel table.
Positioning at the trace start point with X-axis fineadjustment knob.

Navigation function aids leveling

Powerful support for leveling adjustments

When using an optional 3-axis adjustment table or leveling table, a navigation screen is available to help the operator level the surface to be tested.

Vertical adjustment knob

Essential for positioning the stylus close to the workpiece!

Support for testing problematic features

Supports measurement in the axial direction for shrouded features, such as found on crankshafts, by simply swiveling the detector through 90 degrees.

Specifications

Model SJ-500
Order No. 178-533-02A
Type of Data processing Dedicated Data Processor
X-axis measuring range 2in-50mm
Vertical travel Optional Stand
Granite base size Optional Stand
PC unit 13.7×10.4×3.4in/350x263x86mm
Dimension (main unit) 16.7×3.7×6.3in
425x94x160mm
Mass main unit 5.9lbs/2.7kg
Assessed profiles Dedicated data processor type: P (primary profile), R (roughness profile), WC, envelope residual profile, roughness motif,waviness motif
PC system type: P (primary profile), R (roughness profile), WC, WCA, WE, WEA, DIN4776 profile, E (envelope residual profile),roughness motif, waviness motif
Evaluation Parameters Dedicated data processor type: Ra, Rc, Ry, Rz, Rq, Rt, Rmax, Rp, Rv, R3z, Sm, S, Pc, mr (c),?c, mr, tp, Htp, Lo, lr, Ppi, HSC,
?a, ?q, Ku, Sk, Rpk, Rvk, Rk, Mr1, Mr2, A1, A2, Vo, ?a, ?q, R, AR, Rx, W, AW, Wx, Wte,
(43 parameters), Customization
PC system type: Pa, Pq, Psk, Pku, Pp, Pv, Pz, Pt, Pc, PSm, P?q, Pmr (c), Pmr, P?c, Ra, Rq, Rsk, Rku, Rp, Rv, Rz, Rt, Rc, RSm, R?q,
Rmr (c), Rmr, R?c, Wa, Wq, Wsk, Wku, Wp, Wv, Wz, Wt, Wc, WSm, W?q, Wmr (c), Wmr, W?c, Rk, Rpk, Rvk,
Mr1, Mr2, A1, A2, Rx, AR, R, Wx, AW, W, Wte, Ry, RyDIN, RzDIN, R3y, R3z, S, HSC, Lo, lr, ?a, ?a, ?q, Vo, Htp, NR,
NCRX, CPM, SR, SAR, NW, SW, SAW
Analysis Graphs Dedicated data processor type: ADC, BAC, power spectrum graph
PC system type: ADC, BAC Graph, power spectrum graph, auto-correlation graph, Walsh power spectrum graph, Walsh autocorrelation
graph, slope distribution graph, local peak distribution graph, parameter distribution graph
Curved surface compensation Dedicated data processor type: Parabolic compensation, Hyperbolic compensation, Elliptical compensation, Circular compensation
Conic compensation, Inclination (Entire, Arbitrary)
PC system type: Parabolic compensation, Hyperbolic compensation, Elliptical compensation, Circular compensation,
Conic compensation, Inclination (Entire, Arbitrary), Polynomial compensation
Contour analysis Dedicated data processor type: Area, Circle, Angle, Coordinate difference, Step, Inclination
PC system type (SURFPAK-EZ): Area, Circle, Angle, Coordinate difference, Step, Inclination
Filters Dedicated data processor type: 2CR-75%, 2CRPC-75%, Gaussian, Robust-spline
PC system type: 2CR-75%, 2CR-50%, 2CRPC-75%, 2CRPC-50%, Gaussian, Robust-spline

Dimensions